D Impact Device/probe For Leeb Hardness Tester,meter

US $970

  • Saddle River, New Jersey, United States
  • May 29th
D-Probe: Universal standard unit. Will handle the majority of hardness testing applications.Weight: 75g Model No. PHT1800-100 Technical Data for Portable Hardness Tester Impact Devices Note: Impact device D is standard device on all models. Specification is identical. Impact Devices D/DC/DL D+15 C G Impact energy 11Nmm 11Nmm 3Nmm 90Nmm Mass of the impact body 5. 5g 7. 8g 3. 0g 20g   DL: 7.3g       Test tip         * Hardness 1600HV 1600HV 1600HV 1600HV * Diameter 3mm 3mm 3mm 5mm * Material   Tungsten Tungsten   *   carbide carbide   Impact device         * Diameter 20mm 20mm 20mm 30mm * Length 147/86mm 162mm 141mm 254mm * Weight 75/50g 80g 75g 250g Max. hardness of sample 940HV 940HV 1000HV 650HB Preparation of surface         * Roughness class ISO N7 N7 N5 N9 * Max. roughness depth Rt 10 µ m 10 µ m 2.5 µ m 30 µ m * Average roughness Ra 2 µ m 2 µ m 0. 4 µ m 7 µ m Min. weight of sample         * Of compact shape 5kg 5kg 1.5kg 15kg * On solid support 2kg 2kg 0.5kg 5kg * Coupled on plate 0. 1kg 0. 1kg 0. 02kg 0. 5kg Min. thickness of sample         * Coupled 3mm 3mm 1mm 10mm * Min. thickness of layers 0. 8mm 0. 8mm 0. 2mm - * Indentation of test tip         * With 300 HV         * Diameter 0. 54mm 0. 54mm 0. 38mm 1.03mm * Depth 24 µ m 24 µ m 12 µ m 53 µ m * With 600 HV         * Diameter 0. 45mm 0. 45mm 0. 32mm 0.90mm * Depth 17 µ m 17 µ m 8 µ m 41 µ m * With 800 HV         * Diameter 0. 35mm 0. 35mm 0. 30mm - * Depth 10 µ m 10 µ m 7 µ m

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