Hitachi Ls-6700 Semiconductor Particle Measurement System

US $100,000.00

  • San Luis Obispo, California, United States
  • Jan 30th
Description:                 Hitachi LS-6700 High throughput, high resolution dark field imaging system for un-patterned wafer inspection. Inspects particles, micro-scratches, COP’s (crystal oriented particles).  Throughput: Under Normal Inspection Mode – 37 WPH Particle Detection size: 0.05um and higher Wafer Size: Configured for 300mm  Facilities:                 Air:         540 – 640 kPa                 Vacuum:              -80 to -100 kPa                 Power:                 100 VAC +/- 10%, 50/60 Hz, 30 Amp  Service Conditions:                 Cleanroom:        Class 100 or less                 Temperature:    25C +/= 10% This system was professionally crated and is ready for immediate pick-up at no charge.  System sold as is.
Condition:
Used: An item that has been used previously. The item may have some signs of cosmetic wear, but is fully operational and functions as intended. This item may be a floor model or store return that has been used. See the seller’s listing for full details and description of any imperfections. ...
Brand Hitachi
Country/Region of Manufacture United States
Model LS-6700 Ls6700

Directions

Similar products from Cachets & Wafers

People who viewed this item also vieved

By clicking "Accept All Cookies", you agree to the storing of cookies on your device to enhance site navigation, analyze site usage, and assist in our marketing efforts.

Accept All Cookies