J.A.Woollam M-44 Spectroscopic Ellipsometer, US $25,000.00 – Picture 0

J.A.Woollam M-44 Spectroscopic Ellipsometer, US $25,000.00 – Picture 1

J.A.Woollam M-44 Spectroscopic Ellipsometer, US $25,000.00 – Picture 2

J.A.Woollam M-44 Spectroscopic Ellipsometer, US $25,000.00 – Picture 3

J.A.Woollam M-44 Spectroscopic Ellipsometer, US $25,000.00 – Picture 4

J.A.Woollam M-44 Spectroscopic Ellipsometer, US $25,000.00 – Picture 5

J.a.woollam M-44 Spectroscopic Ellipsometer

US $25,000.00

Mooresville, North Carolina, United States
Jan 30th

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J.A.Woollam M-44 Spectroscopic Ellipsometer New Color 17 inch LCD Monitor Includes Vacuum Pump for wafer stage. New Xenon Lamp with LPS-400 Lamp Power supply Calibrated Network Card Installed on PC Spare Hard Drive with All Software loaded. M-44 Ellipsometer Operator Manual Set O/S Windows 98 WVASE for windows with hardware dongle. Electronics Controller EC-270 Motorized Stage Translation Controller ST-260 Warranty: None. . Spectroscopic ellipsometer – M44 (J.A. Woollam Co., Inc.) Wavelength range: 423nm - 764 nm Resolution: 1.6 nm (5 nm bandwidth) for wavelength < 1000 nm 6.4 nm (12 nm bandwidth for >1000nm Configuration: rotating compensator Ellipsometers for Semiconductor Applications Ellipsometry is the tool of choice for many thin film metrology requirements in the semiconductor industry. A few examples include: · SiO2 · SiC · Poly-Si · low-K · Si3N4 · TiN · Resists · WSix · SiOxNy · Compound semiconductors (GaN, AlGaAs, InP, ...) · ONO (and other multilayer structures) VASE® Research Spectroscopic Ellipsometer The VASE® features highest accuracy measurement in ? and ?, high-precision angle over all wavelengths, and a wide spectral range (400nm to 800nm). Sample is horizontally mounted, motorized stage, and fixed spot size. This is the perfect RESEARCH ellipsometer. Software In-situ Data Acquisition/Analysis Software WVASE32™ The WVASE32 software is the most sophisticated ellipsometric data analysis software in the world VASEManager™ VASEManager software is a front-end program for WVASE32 to automated data acquisition, analysis and mapping in situ spectroscopic ellipsometry is the ideal solution for thin film measurement during deposition and etch. It is sensitive to: layer thickness optical constants surface temperature alloy ratio interfaces surface roughness VASE® (Variable Angle Spectroscopic Ellipsometer) WVASE32TM Ellipsometric Data Acquisition and Analysis Software WVASE32TM is the most powerful and comprehensive ellipsometric analysis program available. It provides more modeling options than any other program. WVASE32TM is also FAST. The software is written in 32-bit programming using C++. It employs state of the art mathematical fitting algorithms for the fastest, most accurate, fits to your data. In addition to modeling and analyzing the ellipsometric data,WVASE32TM also analyzes or generates reflectance and transmission data . WVASE32TM software is highly acclaimed for its large variety of powerful modeling options. The software handles every physical description of effects that are seen optically in your samples. These effects include: · Graded optical constants (n and k vary at different depths in the film). · Surface and interfacial roughness · Thickness non-uniformity · Optical anisotropy (uniaxial and biaxial) · Superlattice structures · Much more!!! VIS: 44 wavelengths from 410nm to 750 nm

Condition	Seller refurbished : An item that has been restored to working order by the eBay seller or a third party not approved by the manufacturer. This means the item has been inspected, cleaned, and repaired to full working order and is in excellent condition. This item may or may not be in original packaging. See the seller’s listing for full details.
Seller Notes	“Seller Refurbished, works to OEM Specifications.”