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Particle Detection System Semiconductor Photomask Solar, US $126,000.00 – Picture 0
Particle Detection System Semiconductor Photomask Solar, US $126,000.00 – Picture 0

Particle Detection System Semiconductor Photomask Solar

US $126,000.00

  • Avon, Massachusetts, United States
  • Jan 30th
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Now available from WIS, Inc., an inspection system that has simultaneous high-throughput, double-sided inspection of photo masks (original design). Easily modified to support other substrates.    Original concept was based on scattering measurement from multiple lasers at grazing angle.  Optical platform consisted of separate reticle chamber with controlled airflow to eliminate any possibility of instrument-generated particle contamination.  Since that time, our concept has continually improved to increase sensitivity, eliminate laser diodes, and increase throughput. Model PDS-1020A incorporates all these improvements in a reduced footprint design. www.waferinspectionservices.com
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New: A brand-new, unused, unopened, undamaged item in its original packaging (where packaging is applicable). Packaging should be the same as what is found in a retail store, unless the item is handmade or was packaged by the manufacturer in non-retail packaging, such as an unprinted box or plastic bag. See the seller's listing for full details. ...
Brand Wafer Inspection Services, Inc.
MPN PDS 1010AU
Model PDS 1010
Country/Region of Manufacture United States

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