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Advantest 6.5GDM DIGITAL Module for T2000 System #1, US $3,500.00 – Picture 0
Advantest 6.5GDM DIGITAL Module for T2000 System #1, US $3,500.00 – Picture 1
Advantest 6.5GDM DIGITAL Module for T2000 System #1, US $3,500.00 – Picture 2
Advantest 6.5GDM DIGITAL Module for T2000 System #1, US $3,500.00 – Picture 3
Advantest 6.5GDM DIGITAL Module for T2000 System #1, US $3,500.00 – Picture 4
Advantest 6.5GDM DIGITAL Module for T2000 System #1, US $3,500.00 – Picture 5
Advantest 6.5GDM DIGITAL Module for T2000 System #1, US $3,500.00 – Picture 6
Advantest 6.5GDM DIGITAL Module for T2000 System #1, US $3,500.00 – Picture 0
Advantest 6.5GDM DIGITAL Module for T2000 System #1, US $3,500.00 – Picture 1
Advantest 6.5GDM DIGITAL Module for T2000 System #1, US $3,500.00 – Picture 2
Advantest 6.5GDM DIGITAL Module for T2000 System #1, US $3,500.00 – Picture 3
Advantest 6.5GDM DIGITAL Module for T2000 System #1, US $3,500.00 – Picture 4
Advantest 6.5GDM DIGITAL Module for T2000 System #1, US $3,500.00 – Picture 5
Advantest 6.5GDM DIGITAL Module for T2000 System #1, US $3,500.00 – Picture 6

Advantest 6.5gdm Digital Module For T2000 System #1

US $3,500.00

  • Etobicoke, Ontario, Canada
  • Jan 30th
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Over Stock item That were Never Used Here is a great chance to save Big. Check out my other auction for Advantest 250MDM module. Auction for Advantest 6.5GDM for supporting test of HDMI ,SATA High-Speed Interfaces. The new Advantest 6.5-Gbps digital module for the T2000 open-architecture test platform can accommodate SOCs employing a variety of Serdes standards, including PCI Express, HDMI,SATA, XAUI and FBDIMM (Fully Buffered Dual Inline Memory Module), as well as source-synchronous devices such as microprocessors. Dubbed the 6.5GDM, the new digital module serves in both characterization and production testing of Serdes interfaces. The module is designed to address the test requirements associated with interfaces that utilize a wide range of clock types—embedded, forwarded, source-synchronous and common clocks—in a single integrated 8-lane/32-pin card. Module features include the handle interfaces like FBDIMM, which, with uneven numbers of Tx and Rx channels, can't be tested on loop-back-only ATE systems. A header-hunt feature allows the tester to track nondeterministic data with variable wait-state insertions, and the module can change data rates on-the-fly. Comparator logic allows the user to measure all traditional Tx parameters, while integrated clock and data recovery allows the tester to track drifting signals.

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