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MTI Instruments Proforma 300 Non-Contact Wafer Thickness Measurement System GaAs, US $4,962.00 – Picture 0
MTI Instruments Proforma 300 Non-Contact Wafer Thickness Measurement System GaAs, US $4,962.00 – Picture 0

Mti Instruments Proforma 300 Non-contact Wafer Thickness Measurement System Gaas

US $4,962.00

  • Santa Fe, New Mexico, United States
  • Jan 30th
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The wafer stage is Teflon coated to allow for easy positioning without abrasion and includes removable locating pins to ensure precise center thickness measurements. Its capacity for measuring wafers up to 300 mm in diameter for both thickness and total thickness variation (TTV) comes from placing the wafer between non-contact capacitance probes. Additionally, it doesn't require recalibrating or electrically grounding the wafer, making it fast, accurate, and reliable. This advanced system is available for purchase at $23,997.50, including a 7-day unconditional right of return and a 90-day warranty. Its maximum measurement range or maximum probe/wafer stand-off distance can also be adjusted according to individual requirements. The MTI Instruments Proforma 300 is an advanced wafer thickness measurement system that utilizes proprietary capacitance technology. Thickness and TTV values are indicated on its high-resolution LCD display, while output compatibility is available through an RS-232 port for a personal computer or a parallel port for direct printer output. This non-contact system can function with all types of wafer materials such as silicon, gallium-arsenide, indium phosphide, and germanium. The Proforma 300 comes with a menu-driven interface for quick setup and operation, customizable to one's specific needs.

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