R129851 Gaertner Scientific Ellipsometer Model L117 Semiconductor Plasma Etch

US $3500

  • Columbus, Ohio, United States
  • Oct 20th
L117 Ellipsometer Gaertner Scientific June 1983, 05-LHP-321, 44206 Serial 617-AK Class II He-Ne 632.8 nm Max1mW The Gaertner Scientific Corp. L117 Ellipsometer provides non-contact thickness and refractive index measurements of thin transparent and semi-transparent films to sub-angstrom precision. I don't have the key and I tried to turn on with a screwdriver but the unit doesn't power up. It is in good physical condition but not tested.

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