Tektronix HFS 9009 stimulus system with two HFS 9062 modules The Tektronix HFS9000 Stimulus Systems features a high-performance pulse generator and complete data generation capabilities. There is data and timing on every pin. The HFS9000 has the ability to produce the DC levels needed to drive logic lines directly. Every capability is present on every pin simultaneously, reulting in extremely flexible formatting. You can set up a complete stimulus system in minutes, and test products more thoroughly throughout the development cycle. Digital Architecture The HFS9000 Series products were designed as completely programmable digital instruments rather than being based on traditional monostable analog architecture. This allows more capability and flexibility in pulse edge placement without the restrictions that analog instruments commonly impose. Now you can adjust both Delay and Width from 0 to 20 µs over all frequencies. Modular Design You can build a stimulus system with from four to 36 channels in one mainframe, and 640 or more channels across multiple phase-locked mainframes. The HFS9009 mainframe features 9-slot, 36-Channel capability. All channels are slaved to a common clock, resulting in accurate channel-to-channel edge placement. This makes the HFS9000 ideal for characterization and evaluation of synchronous devices having multiple, and possibly interactive, inputs. Full Channel Deskew Capability All HFS9000 channels have independent, wide deskew ranges to allow precise pulse alignment and timing at the device under test (DUT). Deskew compensates for the timing differences caused by cabling and fixturing so your analysis can be focused on the relative timing at the DUT. 1 ps Timing Resolution No other system lets you generate whatever combination of signals is required, with data and timing on every pin with 1 ps resolution. You can create data buses, clocks, strobes, gated clocks, logic level sources, pseudorandom bits and other stimuli with unequaled accuracy. You can perform setup and hold time margin tests by providing the clock, data, set and reset signals to the DUT. You can hold inactive signals at programmable high or low logic levels, eliminating the need for external DC voltage sources and microwave switches. 630 MHz Repetition Rate Accurate and repeatable AC measurements of prop delay, setup and hold time, and maximum operating frequency (fmax) require fast rep rates and edge speeds. With repetition rates up to 630 MHz, the HFS9000 is ideal for characterizing the most advanced logic families, and it can be used for testing component compliance with the SONET telecommunications standard. Transition times as fast as 250 ps (20%-80%) enable repeatable and accurate testing of the highest-speed ECL and GaAs digital devices. Variable transition time control from 800 ps to 6 ns is also available with the appropriate output levels for testing advanced CMOS, BiCMOS and TTL logic families. Easy Editing of Setups and Vectors Edit setups and vectors easily with BitWriter® software. With this Microsoft Windows based package you can build a complete test setup, including timing parameters, voltage levels, channel assignment and test vectors on your PC - ideal for remote test development. Individual setups and test vectors can be uploaded and stored when the HFS9000 has multiple users. Fully Programmable Programmability is important in developing automated, repeatable tests in R&D, incoming inspection and production of high-speed components. Therefore, the HFS9000 offers full implementation of the IEEE 488.2 standard and utilizes Tektronix Codes and Formats. GPIB/RS-232 ports provide for remote, fully programmable control. Phase Lock Mode Phase lock-in allows the internal time base to be phase-locked to an external frequency source. This "supercharger" capability can be used to augment the speed performance of automated component test systems by creating synchronized signals as fast as 630 MHz. Configuration Options Card-modular design lets you adapt to any logic family from within the same mainframe. Features Complete Stimulus Setup in Just Minutes Specify Data and Timing on Every Pin Up to 630 MHz Repetition Rate Fully Digital Implementation Multi-channel Architecture Up to 640 or More Phase-locked Channels Independent Edge Placement Channel Deskew Precision Channel-to-channel Timing Alignment 1 ps Timing Resolution GPIB (IEEE 488) Programmable Modular Construction Upgrade Capability The HFS9DG2 provides four channels of stimulus. This card is ideal for simulating TTL, CMOS and BiCMOS logic signals. Combine these cards in any combination for testing a broad range of components or systems with mixed logic families. Applications From verifying critical parameters to full characterization, from developing manufacturing test vectors on the bench to phase-locked at-speed testing in conjunction with production test systems, the HFS9000 Data Time Generator simplifies the process while adding unmatched capabilities. Download test vectors and timing parameters to the HFS9000 to set up worst-case conditions and to stimulate each pin in isolation. Vary voltage levels, pulse widths and timing relationships independently for each channel. Mix high-speed and variable transition time modules to fit your logic family and obtain channel counts unavailable in any other discrete instrument. The Data Time Generator also provides a new dimension of assistance in characterizing pattern sensitivity. It provides the data stream while also creating the varying signal levels, timing relationships or signal characteristics required to detect pattern sensitivity across worst-case operating conditions. UNTESTED, used. NEEDS NOTCHED TYPE POWER CORD (not included). minor cosmetic issues. You are bidding on the pictured item only. Unit is sold AS-IS no warranty. Buyer may return the item and is responsible for shipping charges. tel: 877-417-7413 EBAY SALES TERMS AND CONDITIONS ***all Paypal purchases must deliver to a confirmed address*** The sale of all equipment described herein is conditioned upon the Terms and Conditions contained herein. Any additional or different terms that are proposed by the customer are hereby objected to and will not be binding upon Liberty Test Equipment unless specifically agreed to in writing by Liberty Test Equipment. 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