Veeco FPP-100 Four Point Probe System FPP100 Wafer Ready to Ship., US $3,999.99 – Picture 0

Veeco FPP-100 Four Point Probe System FPP100 Wafer Ready to Ship., US $3,999.99 – Picture 1

Veeco FPP-100 Four Point Probe System FPP100 Wafer Ready to Ship., US $3,999.99 – Picture 2

Veeco Fpp-100 Four Point Probe System Fpp100 Wafer Ready To Ship.

US $3,999.99

Phoenix, Arizona, United States
Jan 30th

Open on mobile:
QR code

Veeco FPP-100 Four Point Probe Comes with a manual and what you see in the pictures. If you don't see it, you probably wont get it. Specifications are from Veeco and may vary slightly due to upgrades, options, or revisions this unit may or may not have. This unit is guaranteed to work. We are not a calibration lab however. Quantity available, only 1 sold in the auction. The Unit's Serial Number Tag Reads: Model Number: FPP100 Power Requirements: 120 VAC Key Features: Compact integral probe and display. Digital display and computation. Automatic ranging. Four selectable displays. Sheet resistivity. V/I. Slice resistivity (bulk resistivity of a slice of known thickness) Metallization thickness (displayed directly in K-Angstroms) Digital input of slice thickness or bulk resistivity. Automatically makes measurement each time probe is lowered. Retest and Reverse push buttons allow additional measurements without disturbing probes. Automatically holds last reading after probe is released and until next measurement is made. Flashing display indicates questionable or invalid test. Extended measurement range. Displays sheet resistivity up to 100 K?/sq. Displays sheet resistivity resolution down to .01 m?/sq. High accuracy of ±.5% of reading on all but extreme ranges. Unique auto zero circuit minimizes thermal and source impedance effects. FET input amplifier features low bias current. Continuously variable test current allows test current to be minimized consistant with an acceptable signal to noise ratio. True ratio measurement. Integral RFI and light shield for high resistivity measurements. Unique "constant force" spring balance system assures repeatable probe pressure. Probe pressure conveniently set by means of calibrated adjustment knob. Plug-in probe head adaptors make probe head changing convenient and non-critical. Unique, indexed substrate holder allows semi-repeatable probe positioning on substrate. Probe head is viscously lowered. Heavy base and compliant feet minimize susceptibility to vibration. Automatic determination of semiconductor type if desired. Automatically utilizes either rectification or thermoelectric typing as required. Automatic penetration if desired. Penetration and typing modes can be individually disabled by means of internal switches. Very low power requirement. No batteries required. Description: The FPP-100 was designed to simplify measurement of the resistive properties of semiconductor wafers and resistive films. It digitally computes and directly displays V/I, sheet resistivity, slice resistivity, or thickness as desired. It features a single compact package which incorporates both the probe mechanism and display. The rugged cast aluminum case assures mechanical integrity of the probe mechanism and coupled with compliant feet helps to reduce the adverse effects of vibration. The selected measured quantity is calculated and displayed digitally. The last measurement continues to be displayed until a new measurement is made, thus simplifying data recording. Automatic ranging and automatic zeroing results in maximum operator convenience, and minimizes the possibility of operator error. An indexing substrate holder (I don't believe this is included) allows repeatable probe positioning. A unique spring balance mechanization results in easily adjusted and repeatable probe pressures. Plug in adaptors to simplify the changing of probe heads and adaptors are available commercially. RFI (radio frequency interference) and light effects on high resistivity semiconductor materials are minimized by an integral light and RFI shield. The probe tips are unpowered until contact is made and probe lowering is viscous damped. A measurement is automatically made each time the probe is lowered. Additional measurements can be made without lifting the probe by depressing a RETEST button. Pressing of the REVERSE current button will also produce an additional measurement except that in this case the direction of the test current is reversed. A questionable or invalid test is indicated by a flashing display. The maximum measurable sheet resistivity is 99.99 K?/sq. and the highest resolution is .01m?/sq. Resolution of the digital display is maintained between .5 and .05% except for sheet resistivities below 2 m?/sq. The test current is continuously variable as an inverse function of the actual sheet resistivity. This eliminates the factor of 10 step change in test current which normally occurs at the range switch point and allows an optimum compromise between minimizing test current and maximizing signal level. An FET input amplifier assures very low bias currents and true ratio measurement eliminates the need for accurate voltage reference and an accurate current source. The slice or layer thickness necessary to compute the bulk resistivity of a slice or layer is inputted through digital thumbwheel switches in units of mils or microns. The unit will also display metallization thickness directly in K-Angstroms if the bulk resistivity of the metal film is supplied. The unit will automatically perform a semiconductor type test if desired. A rectification test is tried first. If the results are inconclusive a thermoelectric test is attempted. If the results is still inconclusive a flashing display indicates that the sample type could not be determined. If desired, the unit will supply a short low energy, high voltage pulse to the probe tips in order to penetrate any thin insulating layer on the sample. Both penetration and typing tests are only performed if activated by front panel switches. Both can be individually disabled internally if their inadvertent application would be detrimental to the sample. Specifications: Probe Head: The FPP-100 can be used with any of the commonly available probe heads (this unit has an Alessi probe head). Probe Mechanism: :Mechanism Type: Parallel beam with flexural pivots. Probe force established by a unique constant force spring balance system. Probe Force Adjustment Range: 0 to 200 gm/pin. Probe Force Calibration Accuracy: ±5% or ±2 gm whichever is greater.* Probe Force Variation with Height: Less than 0.2 gm/mil.** Size: 12.5" W x 11.0" D x 6.3" H Weight: 15 lbs. Notes: *: Refers to the total of all four pins. Pin to pin force variation is controlled by the probe head manufacturer. **: Average per pin force. For More Pictures Please Click the Following: Picture 2 - Back View Picture 3 - Front Control Panel Picture 4 - Sample Area Picture 5 - Probe Head, Up-Close $75.00 minimum for packaging, handling, and order processing. Shipping to be determined by destination. If you have any questions please email us at: ebay@mhzelectronics.com or call Michael at 1-866-MHZ-ELEC (1-866-649-3532) Toll Free. Also, please click here to view or other auctions! 02/21/08 Powered by eBay Turbo Lister The free listing tool. List your items fast and easy and manage your active items. On Oct-31-13 at 21:11:25 PDT, seller added the following information: Click Here. Double your traffic. Get Vendio Gallery - Now FREE!

Condition:	Seller refurbished: An item that has been restored to working order by the eBay seller or a third party not approved by the manufacturer. This means the item has been inspected, cleaned, and repaired to full working order and is in excellent condition. This item may or may not be in original packaging. See the seller’s listing for full details. ...	Brand	Veeco
Model	FPP-100