Wafer Inspection Machine Baumann / Semilab / Gp Solar -80%

US $60,000.00

  • Hilden, Germany
  • Jan 30th
We offer here a complete Wafer Inspection Machine. NEW and UNUSED Normalprice is: 300.000,00 USD We offer from insolvency, -80% from Normalprice *FREE SHIPPING* Machine is in original Karton and with Foil Pallet is: 3,20m x 1,50m x 2,20 Weight is: 800kg Specifications   Baumann Wafer inspection unit          built 2011 / for project 2012 Semilab WMT-3 Thickness and resistivity measurement GP Solar WAF-Q cam Geometrical and surface COMPLETE STREET !!!  !!! NEW and UNUSED !!! Semilab WMT-3 Resistivity, Thickness Inline, 3 measurement heads Non contact method: eddy currents Thickness and resistivity measurement (Integration into stack splitter) GP SOLAR WAF-Q Samples to be measured: Monocrystalline, Multicrystalline and Cast-Mono wafers and cells, Square or pseudo square Wafer size: 100 ... 156 mm Camera model: 4M Matrix, optional 11M Matrix Defect resolution: 80 µm / 60 µm Measured features: Geometry (Edge lengths, Edge Angles, Chamfer lengths, Diagonals), Contour and surface defects (type, length, depth, area), Chipping defects (width, height, area) Stand Still time: 25 ms / 25 ms Minimum cycle time: 1 s Geometrical and surface wafer inspection Intrusions into the outer contour :150 µm Chipping: 300 µm General surface defects: 2 mm Cracks and holes: 200 µm Note: including handling unit (chamber) with conveyors, computer and more
Condition:
New: A brand-new, unused, unopened, undamaged item in its original packaging (where packaging is applicable). Packaging should be the same as what is found in a retail store, unless the item is handmade or was packaged by the manufacturer in non-retail packaging, such as an unprinted box or plastic bag. See the seller's listing for full details. ...
Brand BAUMANN
MPN GP SOLAR
Model SEMILAB
Country/Region of Manufacture Germany

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