Cde Resmap 178 Four Point Probe Resistivity Mapping System Tag #78

US $2200

  • Freehold, New Jersey, United States
  • Nov 23rd
The CDE Resmap 178 Four Point Probe Resistivity Mapping System, tagged as #78, is perfect for process development and tool characterization engineers. It boasts of high accuracy, repeatability, and reliability in measuring resistivity. Its measurement range is between 2 milliohms per sq. to 5 megaohms per sq. with the option to optimize it to 1 milliohm per sq. It can measure wafers with a size of 2 to 8 inches through manual load. Buyers have the option to purchase the CDE Resmap 178 as-is or have it checked and refurbished by one of our technicians. It comes with a standard right to return and a 3-month parts warranty. Please note that international buyers should check with their country's customs office for import duties, taxes, and charges that may not be included in the item price or shipping cost. Contact a freight forwarder for actual prices. The CDE Resmap 178's mapping patterns are as follows: polar map (aligned with notch/flat), rectangular map (with inside edge exclusion option), line scan (diameter, radius, or point to point diameter with a minimum step of 0.1mm), and user-defined with template. It only takes one second to measure each site. For inquiries or additional information about the product and pricing, please contact us via eBay mail or at phone # (732) 863-9500. BID SERVICE has been in the semiconductor and scientific equipment industry for 30 years, providing customers with expert refurbishing services, demo capabilities, and a broad inventory selection.

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