CTC T-STAR 1000 T1/Digital T-Carrier Analyzer Loop Carrier Test Set/Simulator, US $499.99 – Picture 0

CTC T-STAR 1000 T1/Digital T-Carrier Analyzer Loop Carrier Test Set/Simulator, US $499.99 – Picture 1

CTC T-STAR 1000 T1/Digital T-Carrier Analyzer Loop Carrier Test Set/Simulator, US $499.99 – Picture 2

Ctc T-star 1000 T1/digital T-carrier Analyzer Loop Carrier Test Set/simulator

US $499.99

Phoenix, Arizona, United States
Mar 2nd

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Click Here. Double your traffic. Get Vendio Gallery - Now FREE! Compression Techniques Corporation T-STAR 1000 T-Carrier Analyzer/Simulator Comes with a manual, AC adapter, and what you see in the pictures. If you don't see it, you probably wont get it. Specifications are from CTC and may vary slightly due to upgrades, options, or revisions this unit may or may not have. The unit is guaranteed to work. The Unit's Serial Number Tag Reads: Model Number: T-STAR 1000 Serial Number: 1031 Information from the Unit: Software Version: 3.1 Dial Option: Installed Remote Option: Not Installed Description: The T-STAR 1000 is a compact, portable instrument that provides bit error performance testing of DS1/T1 transmission and switching equipment, plus drop and insert capabilities for VF channel measurements and signaling analysis. It can be powered from a standard 115 VAC source for long-term performance monitoring or from an internal rechargeable battery for portable use. An accessory Network Adapter is available from the factory to connect the T-Star 1000 directly to a T1 span line, in place of a CSU. The instrument is menu-driven and operated from a keyboard with the pushbutton controls grouped functionally in an easy-to-use arrangement. A large viewing screen on the T-Star 1000 displays selected test setups, measurement results, and control functions. The T-Star 1000 has a data memory facility that logs accumulated test results and alarm events. Information stored in memory can be viewed on screen or transferred to a printer for a hardcopy record of test results and events. In addition, up to 5 user-defined test setups can be programmed and stored in a separate memory. This important feature eliminates human errors in setting up tests and saves time in performing frequent measurements. T1/DS1 Interface (East-West) Specifications: Interface Modes: Terminating, Bridging, VF Channel Drop/Insert (term. & bridging) Input: Terminating Modes: Impedance Mode: 100 Ohms, ±10% Level Range: 0 to -34 dB (referenced to DSX-1 level) Bridging Mode: Impedance: 1000 Ohms, ±10% Level Range: 0 to -22 dB (reference to DSX-1 level) Output: Impedance: 100 Ohms, ±10% Pulse Amplitude: ±3 volts (DSX-1 Compatible) Equalization (feet): Switch selectable; 0-100, 100-350, 350-650 Input Clock Frequency: 1.544 MHz, ±300 ppm Transmit Clock: Recovered or Internal: 1.544 MHz, ±25 ppm (0-70 C) External: 3000 Ohms Signal Format: DS1 PCM, 1.544 Mbps, 24 channels Channel Formats: D1D, D2, D3, & D4 Framing Formats: Superframe (SF) and Extended Superframe (ESF), with and without signaling; and Unframed Line Coding: Alternative Mark Inversion (AMI), Bipolar 8-Zero Substitution (BZ8S), Bit 7 Stuffing (B7) APS Test Pattern Formats: Standard (Bell System) & Type 51A Bit Error Test Functions Specifications: Test Patterns: QRSS: Quasi-Random signal Source (per Bell Spec. CB113). Test pattern contains 2^x-1 (Choice of 5): Pseudorandom bit patterns where "x" is 6, 9, 11, 15, or 20, corresponding to pattern lenghts of 63, 511, 2047, 32767, and 1048575 bits, respectively. No more than X "zeros" or X-1 "ones" can occur consecutively. 1:N (Choice of 3): User defined 8-bit pattern containing any combination of "ones" and "zeros. Error Injection (into Test Pattern): Auto-Injection Rates: Logic & BPV Errors: 10E-3 to 10E-8 Framing Bit Errors (1 error in X frame bits): 1:2, 1:5, 1:10, & 1:50, 1:100 Manual Injection: 1 bit error at a time (logic, BPV & frame) Bit Error Measurements: BERT Synchronization Modes: Auto & Manual Type of Bit Errors: Logic, Frame, Bipolar Violations, and CRC-6 Types of Measurements: Bit Errors, Errored Seconds, Error-Free Seconds, Bit Error Rate (ratio of bit errors to total bits counted) Test Lengths for Bit Error Rate Measurements: (Test Length = Total Bits Counted in Measurement) Logic & Bipolar Tests: 10E5, 10E6, 10E7, 10E8 bits, plus Autoranging. Frame Tests: 10E4, 10E5, & 10E6 bits, plus autoranging. CRC-6 Tests: 10E3, 10E4, 10E5 bits, plus autoranging. Autoranging: TL maintained at one order of magnitude (X10) above error count. VF Functions Specifications: Channel Formats: D1D, D2, D3/D4 Channel Access Modes: Single, Scan, or Scroll VF Output: Impedance: 600 Ohms, ±10% Level Adjust Range: 0 to +23 dB Connectors:

“The unit is guaranteed to work.”

Brand	Compression Techniques
Model	T-STAR 1000