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Jeol jsm-6320f sem scanning electron microscope system untested as-is for sale

Jeol jsm-6320f sem scanning electron microscope system untested as-is

  • Albuquerque, New Mexico, United States
  • US $10,008.14
  • Jan 30th
JEOL JSM-6320F SEM Scanning Electron Microscope System Untested As-Is Inventory # CONB-15326 This JEOL JSM-6320F is used untested surplus. Sold as a set with microscope unit and control unit. There are some components missing from the microscope unit.

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