Tektronix/rohde & Schwarz Cmd 80 Digital Radio Test Set

US $4,999.99

  • Phoenix, Arizona, United States
  • Jan 29th
The CMD80's flexibility allows users to modify almost every signaling and measurement parameter, either dynamically during a test or in advance. Even the tolerances for pass/fail verdicts can be changed to match the requirements of the application. The CMD80 is user-friendly, with a large high-contrast liquid crystal display and softkeys for easy access to test routines under menu control. The instrument is fast and yields high throughput in production, with all essential characteristics of a mobile station tested with high accuracy. The Tektronix/Rohde & Schwarz CMD 80 is a mobile handset tester optimized for manufacturing test environments. It supports multiple network types, including CDMA, IS-136 (NEW), AMPS, NAMPS, ETACS, and NTACS, without the need for external modules. This allows handset manufacturers to create universal test lines, reducing the amount spent on spares, training, manufacturing space, and labor. Specifications include CDMA frequency range, output level, modulation, power measurement, and timebase. The CMD80 can also be upgraded with various options, including an OCXO reference oscillator, rate set 2 (13K) vocoder, reference frequency input/output, AWGN generator, AMPS support, TDMA support, and cellular/PCS frequencies in a single test set. The CMD80 is designed for maximum speed and throughput, with benchmarks and field trials demonstrating up to 20% faster performance than major competitors. The tester uses test "environments" to execute tests with minimal coding required, reducing test time overhead and the time required to construct and support test programs. The CMD80 Digital Radio Communication Tester is compact and can verify mobile RF parameters under conditions almost identical to those in a real network. It simulates a base station, including synchronizing and registering the mobile, making incoming/outgoing calls, and performing measurements without any special test modes in the device-under-tester.

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