Testing & Assembly Equipment (Semiconductors Production Tools) for sale, page 64

K&s 8028 wire ball bonder kulicke & soffa high speed fine pitch wire bonding

Orlando, Florida, United States
Jan 30th

Newport 25792-01 rev e axis board for esp300 controller with 30 day warranty

Santa Ana, California, United States
Jan 30th

Newport Axis board for ESP300 controller 25792-01 REV E ***requires an empty slot in your ESP300 controller***

Mct 4600 / 4610 44 pin test contactor, p/n 132912 rev h - new

Boulder Creek, California, United States
Jan 30th

This MCT 44 LCC Test Contactor appears to new and unused. It looks like it's in the original packaging. Presumed good, but untested.

5501 westbond west-bond west bond 7200aa pick and place bonder

Minneapolis, Minnesota, United States
Jan 30th

5271 wentworth labs prober with leica scope model 0-021-0200

Minneapolis, Minnesota, United States
Jan 30th

Mct 4600 / 4610 52 pin plcc test contactor, p/n 135660 rev c

Boulder Creek, California, United States
Jan 30th

This MCT 52 Pin LCC Test Contactor appears used, but with light use. Presumed good, but untested. We do not have the expertise to test further.

Guzik s-1701a micro positioning spinstand head (hga) + head stack (hsa) testing

Saint Paul, Minnesota, United States
Jan 30th

Guzik S-1701A Micro Positioning Spinstand head (HGA) and head stack (HSA) testing Parts machine, sold as is Closed loop positioning system consisting of a piezo substage and precision optical scales with 0.04 µInch resolution This came in a very nice, padded shipping crate. It's obviously been cannabilized. Don't know enough about this to guess what missing or what's left.

M.e.c electrode manometer vespel 200mm svg semiconductor (non copper kit)

Redwood City, California, United States
Jan 30th

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Hp agilent e1438a 75000 series c filter + fifo with 30 day warranty

Santa Ana, California, United States
Jan 30th

HP Agilent 75000 Series C Filter + FIFO Model: E1438A

Analogic dbs 2050a arbitary waveform generator 2.4 gs/s, vxi bus c-size module

Santa Ana, California, United States
Jan 30th

Analogic Arbitary Waveform Generator 2.4 GS/s VXI Bus C-Size Module Model: DBS 2050A

Racal dana 1260-35a 2 wire 125v 1a reconfigurable scanner/mux 404944-100

Santa Ana, California, United States
Jan 30th

Racal Dana Instruments 2 Wire, 125V, 1A, Reconfigurable Scanner/Mux Model: 1260-35A P/N 404944-100

Racal 1260-100 adapt-a-switch carrier module 407637 405108-001 w/30 day warranty

Santa Ana, California, United States
Jan 30th

Racal Instruments Adapt-A-Switch Carrier Module Model: 1260-100 P/N 407637 Card Configuration Option 01T P/N 405108-001

Tektronix vx4790 25 mhz arbitrary waveform generator module igs-1606-30 warranty

Santa Ana, California, United States
Jan 30th

Tektronix 25 MHz Arbitrary Waveform Generator Module Model: VX4790 Configuration IGS-1606-30

Tektronix vx4802 programmable digital i/o option 01 with 30 day warranty

Santa Ana, California, United States
Jan 30th

Tektronix Programmable Digital I/O Model:VX4802 Option 01

Smc pap3310-p11 process pump with 30 day warranty

Santa Ana, California, United States
Jan 30th

SMC Process Pump Model: PAP3310-P11 Item comes from a clean room tool and is in good, working condition with 30 day warranty.

Nippon pillar packing co pse2mpw3w2 bellows pump with 30 day warranty

Santa Ana, California, United States
Jan 30th

Nippon Pillar Packing Co Bellows Pump Model: PSE2MPW3W2 Item comes from a clean room tool and is in good, working condition with 30 day warranty.

Nippon pillar packing co pse10mp1912 bellows pump with 30 day warranty

Santa Ana, California, United States
Jan 30th

Nippon Pillar Packing Co Bellows Pump Model: PSE10MP1912 Item comes from a clean room tool and is in good, working condition with 30 day warranty.

Ifr 5220 power manufacturing defects analyzer

Phoenix, Arizona, United States
Jan 30th

IFR 5220 Power Manufacturing Defects Analyzer Excellent Condition - Untested - Sold AS-IS The 5200 series is the fastest analog test system available, combining high speed and the ability to accurately test a wide range of component types, effectively blurring the line between MDA, or analog In-Circuit, and full digital In-Circuit.