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Jeol jsm-6320f sem scanning electron microscope system untested as-is

Albuquerque, New Mexico, United States
US $10,008.14
Jan 30th

JEOL JSM-6320F SEM Scanning Electron Microscope System Untested As-Is Inventory # CONB-15326 This JEOL JSM-6320F is used untested surplus. Sold as a set with microscope unit and control unit. There are some components missing from the microscope unit.

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Hitachi s-2400 sem/4pi silicon drift x-ray detector/quorum sc7620 coater/chiller

Climax Springs, Missouri, United States
US $62,999.25
Jan 30th

Hitachi S-2400 SEM/4pi Silicon Drift X-Ray Detector/Quorum SC7620 Sputter Coater/Dimplex JT500 Chiller Hitachi S-2400 was developed for high resolution